Large interior for multiple device testing
- 8 x 16.5 x 10.5 inches, 205 x 420 x 270 mm inside
- Wide selection of I/O options using universal I/O plate
- Large enough for system tests
- Rugged welded aluminum construction
- Dual latches ensure tight RF shielding
- Excellent RF Isolation
Developed expressly for high volume testing of larger RF devices, the JRE 1812 is roomy enough for holding both TX and RX devices for actual on-air tests. Top loading keeps door swing out of the way on congested benchtops.
Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan. Universal I/O plate allows almost any device to be interfaced inside the enclosure, and internal electromagnetic absorbing material reduces RF reflections and hot-spots. Unit shown with populated I/O plate for illustration.
Download datasheet: JRE1812
Features and Benefits
- Double contact door shields ensures repeatable measurements
- 3/4" (20 mm) thick RF absorbing foam deadens standing waves and reflections
- Heavy duty stainless steel friction hinge holds lid steady
- Rugged welded aluminum construction for long life
- Wide variety of connector options for every use
- Optional enhanced version for > 100dB isolation to 28GHz (add "MW" suffix to part number)
Universal I/O plate (4.5" x 7" 115 x180mm) with incredible connector options. Easily changed in the field for multiple uses. JRE Test "B" size I/O plate.
Standard product: -100dB from DC to 1GHz, -95dB to 3GHz, -85dB to 6GHz
Enhanced 5G/Microwave option (product suffix "MW"): -120dB to 1GHz, -115dB to 3GHz, -100dB to 28GHz
Outside: 8.5" H x 18" W x 12" D
250 x 460 x 305 mm
Inside: 8" H x 16.5" W x 10.5" D
205 x 420 x 270 mm
JRE 1812 I/O Options
Configuring your JRE RF Test Chamber is simple, fast and easy.
Determine what sort of I/O connections are needed for your particular test needs. All I/O is contained on the removable I/O plate and this plate is custom designed and manufactured for your particular needs. A wide variety of filtered I/O interfaces are available as well as RF connectors, filtered feed-through capacitors, power strips, and ventilation options are available.
Contact JRE with your requirements and a custom I/O plate will be designed expressly for your test chamber. This plate will then be populated with the selected interfaces, mounted on the test chamber, final tested and then shipped to you. JRE’s extensive inventory allows us to ship your custom configured test chamber in as little as two to three days!
The world leader for a reason...
JRE’s RF Test chambers are used by hundreds of test labs and production facilities throughout the world. Fast off-the-shelf delivery, superb technical support and leading edge patented designs help you to confidently design and test any wireless product with exact, repeatable results. The industry's widest line of standard RF test enclosures provides superior isolation from VLF to over 6 GHz, covering the entire range of popular commercial, private and government communications systems. Need to go higher for 5G or microwave tests? Our 'Enhanced' option provides industry leading isolation all the way up to 28 GHz. Whether you are designing, integrating, or production testing the next generation Wi-Fi, WLAN, 5G Cellular, or IoT, you can rely on JRE to ensure your tests are reliable and repeatable.