Large sized enclosure with dual I/O plates for maximum capability
- Roomy 28.5 x 20.5 x 31.5 inches 1025 x 520 x 800 mm inside
- Quad hinges keep door sealed RF tight
- Two vent capability
- Rugged welded aluminum construction
- Triple ramp door closure for tight RF seal
- Easily holds tall devices
Have a device that requires plenty of I/O connectivity? The JRE 2233 with its two I/O plates allows plenty of connector options for most any device testing needs. Also available is the option to add two 80mm fans for ventilation, if needed. Our triple locking ramp door assembly securely locks the door for tight RF shielding and ensures long life for repeatable tests.
Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble free operation over its lifespan. Quad hinge points on the door reduces 'play' and an entry ramp reduces door misalignment, allowing dependable tight RF shielding over time.
Our wide selection of I/O connectors allow almost any device to be interfaced inside the enclosure, and internal electromagnetic absorbing material reduces RF reflections and hot-spots.
Download datasheet: JRE2233
Features and Benefits
- Double contact door shields ensures repeatable measurements
- 3/4" (19 mm) thick RF absorbing foam deadens standing waves and reflections
- Heavy duty quad stainless steel hinges
- Rugged welded aluminum construction for long life and light weight
- Wide variety of connector options for every use
- Configured for available 80mm fan option
Universal I/O plates (7" x 7" 180 x 180mm) with incredible connector options. Easily changed in the field for multiple uses. JRE Test "C" size I/O plate.
-100dB from DC to 1GHz, -95dB to 3GHz, -85dB to 6GHz
Outside: 30" H x 22" W x 33" D
760 x 560 x 840 mm
Inside: 28.5" H x 20.5" W x 31.5" D
725 x 520 x 800 mm
JRE 2233 I/O Options
Configuring your JRE RF Test Chamber is simple, fast and easy.
Determine what sort of I/O connections are needed for your particular test needs. All I/O is contained on the removable I/O plate and this plate is custom designed and manufactured for your particular needs. A wide variety of filtered I/O interfaces are available as well as RF connectors, filtered feed-through capacitors, power strips, and ventilation options are available.
Contact JRE with your requirements and a custom I/O plate will be designed expressly for your test chamber. This plate will then be populated with the selected interfaces, mounted on the test chamber, final tested and then shipped to you. JRE’s extensive inventory allows us to ship your custom configured test chamber in as little as two to three days!
The world leader for a reason...
JRE’s RF Test chambers are used by hundreds of test labs and production facilities throughout the world. Fast off-the-shelf delivery, superb technical support and leading edge patented designs help you to confidently design and test any wireless product with exact, repeatable results. The industry's widest line of standard RF test enclosures provides superior isolation from VLF to over 6 GHz, covering the entire range of popular commercial, private and government communications systems. Need to go higher for 5G or microwave tests? Our 'Enhanced' option provides industry leading isolation all the way up to 28 GHz. Whether you are designing, integrating, or production testing the next generation Wi-Fi, WLAN, 5G Cellular, or IoT, you can rely on JRE to ensure your tests are reliable and repeatable.