Our largest benchtop enclosure - ideal for tall RF devices
- Roomy 34.5 x 26 x 28.5 inches 875 x 725 x 660 mm inside
- Quad hinges keep door sealed RF tight
- Wide selection of I/O options using three of our universal I/O plates!
- Rugged welded aluminum construction
- Triple cam latches ensure tight RF shielding
- Easy low cost UPS shipping - Worldwide! No Pallets required – Saves $1,000’s
For testing tall devices, the JRE 3036 is ideal! Large enough to fit entire computer systems inside, as well as their associated components, everything will be securely isolated from the outside world.
Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble free operation over its lifespan. A rugged cam style locking closure ensures tight RF shielding while four heavy duty stainless steel hinges minimizes door droop.
Our wide selection of I/O connectors allow almost any device to be interfaced inside the enclosure, and internal electromagnetic absorbing material reduces RF reflections and hot-spots.
Download datasheet: JRE3036
Features and Benefits
- Double contact door shields ensures repeatable measurements
- 3/4" (19 mm) thick RF absorbing foam deadens standing waves and reflections
- Heavy duty quad stainless steel friction hinges
- Rugged welded aluminum construction for long life
- Wide variety of connector options for every use
- 80mm vent option, AC or DC fan is available
Three universal I/O plates (7" x 7" 180 x180mm) with incredible connector options. Easily changed in the field for multiple uses. JRE Test "C" size I/O plates.
-100dB from DC to 1GHz, -95dB to 3GHz, -85dB to 6GHz
Outside: 36" H x 27.5" W x 30" D
915 x 700 x 760 mm
Inside: 34.5" H x 26" W x 28.5" D
875 x 660 x 725 mm
JRE 3036 I/O Options
Configuring your JRE RF Test Chamber is simple, fast and easy.
Determine what sort of I/O connections are needed for your particular test needs. All I/O is contained on the removable I/O plate and this plate is custom designed and manufactured for your particular needs. A wide variety of filtered I/O interfaces are available as well as RF connectors, filtered feed-through capacitors, power strips, and ventilation options are available.
Contact JRE with your requirements and a custom I/O plate will be designed expressly for your test chamber. This plate will then be populated with the selected interfaces, mounted on the test chamber, final tested and then shipped to you. JRE’s extensive inventory allows us to ship your custom configured test chamber in as little as two to three days!
The world leader for a reason...
JRE’s RF Test chambers are used by hundreds of test labs and production facilities throughout the world. Fast off-the-shelf delivery, superb technical support and leading edge patented designs help you to confidently design and test any wireless product with exact, repeatable results. The industry's widest line of standard RF test enclosures provides superior isolation from VLF to over 6 GHz, covering the entire range of popular commercial, private and government communications systems. Need to go higher for 5G or microwave tests? Our 'Enhanced' option provides industry leading isolation all the way up to 28 GHz. Whether you are designing, integrating, or production testing the next generation Wi-Fi, WLAN, 5G Cellular, or IoT, you can rely on JRE to ensure your tests are reliable and repeatable.