Description
Designed for I/O-intensive device tests — a roomy, rack-mountable enclosure with two full I/O plates for test systems that need a huge number of connections.
- Roomy 15.75 x 12.75 x 9 inches inside (400 x 320 x 230 mm) in a 17" wide x 14" deep rack-friendly package
- Excellent RF shielding isolation: −100 dB DC to 1 GHz, −95 dB to 3 GHz, −85 dB to 6 GHz
- Huge amount of I/O using two removable C-size I/O plates — reconfigurable as your test needs change
- Dual hinges and secure latch keep the wide-opening door sealed RF-tight
- Easy mounting in a standard 19" rack
- Four 60 mm 'honeycomb' vents — two front and two rear — for good airflow; optional fans available for greater ventilation
- Keyed locking latch available (add $29)
- Rugged welded aluminum construction, made in the USA on our own fabrication line
- Optional MW upgrade extends isolation to 28 GHz for 5G FR2, UWB, and Wi-Fi 6E/7 work
- Please note: test chambers do not include any RF connectors or interface filters. Any connection to a device inside the chamber must be suitably filtered to maintain shielding isolation. See the filtered interface and connector options below.
Rack-Mounted, I/O-Rich Test Station
The roomy JRE 1714 is the answer for rack-mounting your test system. A wide-opening side door allows easy access to test devices inside, while vents front and rear provide good airflow — optional fans may be installed for greater ventilation. The dual large C-size I/O plates (shown unpopulated in the photo) leave plenty of room for the connectors, filters, and interfaces your devices need, which is exactly why this enclosure lands in I/O-heavy, permanently racked test setups. If you need to rack-mount taller devices, the JRE 1720 offers the same C-size plates in a tall format with optional rack rails.
Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long-life door gasket material along with our double-edge contact engagement provides solid RF shielding and smooth, trouble-free operation over the life of the chamber. The extra-wide opening makes placement of internal devices easy. Inside, LS-30 RF absorbing foam tames reflections and hot-spots so your measurements stay clean and repeatable.
The Removable I/O Plate — Your Chamber Never Becomes Obsolete
Every JRE chamber uses a removable, CNC-machined I/O plate — a design JRE engineers originated over forty years ago. The two C-size plates recess into the chamber wall and do not intrude into your test volume. Because they swap out in the field with a few screws, one 1714 can be reconfigured for many different test setups over its life. Our wide selection of filtered I/O interfaces — USB, Ethernet, power, HDMI and more — lets almost any device be connected inside while keeping the RF environment sealed up tight. Browse the C-size populated I/O plates for the most common pre-built configurations.
Not sure what connections you need? The Configuration Worksheet is a quick way to organize your interface and connector needs before you order. Tell us exactly what RF connectors and filtered interfaces you require and we will build and final-test your chamber in the exact configuration you will be using.
Download datasheet: JRE1714
Features and Benefits
- Double contact door shields ensures repeatable measurements
- 3/4” (19 mm) thick RF absorbing foam deadens standing waves and reflections. Temperature rating of 90 degrees Celsius, UL 94V-0 flammability rating
- Heavy duty dual stainless steel hinges
- Rugged welded aluminum construction for long life
- Wide variety of connector options for every use
- Four 60mm honeycomb style vents, AC or DC fan is available
Connectors
Two universal I/O plates (7" x 7" 180x180mm) with incredible connector options. Easily changed in the field for multiple uses or interchange with other enclosures. JRE Test "C" size I/O Plates.
Isolation
-100dB from DC to 1GHz, -95dB to 3GHz, -85dB to 6GHz
All JRE Test chambers, and many JRE filtered interfaces, can be optionally ordered to operate to 28 GHz @ > 85dB isolation, contact the factory for details
Dimensions and weights
Outside: 10.5" H x 17.25" W x 14.25" D
265 x 440 x 360 mm
Inside: 9" H x 15.75" W x 12.75" D
230 x 400 x 320 mm
Weight: 19 lbs 8.6 kg
Shipping weight and dimensions: 25 lbs 11.4 kg
23" x 22" x 16", 585mm x 560mm x 410mm
JRE 1714 Filtered Interface and Connector I/O Options
Configuring your JRE RF Test Chamber is simple, fast and easy. Choose from these ready-to-go I/O plates with the most common filtered interfaces and connectors and your test chamber can be shipped in just a few days - or have a custom design in about a week, with whatever connectors and filtered interfaces you desire. To help organize your thoughts on what interfaces and connectors you may need, here is a link to a handy 'Configuration Worksheet'.
Want a different set of connectors or filtered interfaces? Contact JRE with your requirements and a custom I/O plate will be designed expressly for your test chamber. This plate will then be populated with the selected interfaces, mounted on the test chamber, final tested and then shipped to you. Other options such as fans, vents. internal AC power strips, fiber optic connectors can all be accommodated. JRE’s extensive inventory allows us to ship your custom configured test chamber in as little as one week!
The world leader for a reason...
JRE’s RF Test chambers are used by hundreds of test labs and production facilities throughout the world. Fast off-the-shelf delivery, superb technical support and leading edge patented designs help you to confidently design and test any wireless product with exact, repeatable results. The industry's widest line of standard RF test enclosures provides superior isolation from VLF to over 6 GHz, covering the entire range of popular commercial, private and government communications systems. Need to go higher for 5G or microwave tests? Our 'Enhanced' option provides industry leading isolation all the way up to 28 GHz. Whether you are designing, integrating, or production testing the next generation Wi-Fi, WLAN, 5G Cellular, or IoT, you can rely on JRE to ensure your tests are reliable and repeatable.






