Designed for I/O intensive device tests
- Roomy 15.75 x 12.75 x 9 inches 400 x 320 x 230 mm insideJRE1714 Front view RF Shielded Test Enclosure
- Dual hinges and secure latch keep door sealed RF tight
- Huge amount of I/O options using two universal I/O plates
- Rugged welded aluminum construction
- Easy mounting in standard 19" rack
- Dual honeycomb vents on front and rear
The roomy JRE 1714 is the answer for rack mounting of your test system. Wide opening door allows easy access to test devices inside, while dual vents front and back provide good airflow. Optional fans may be installed for greater ventilation. Dual large I/O plates (shown unpopulated in the picture) allow plenty of connector, filter and interface to your devices inside the enclosure.
Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble free operation over its lifespan. Extra wide opening for easy placement of internal devices.
Our wide selection of I/O connectors allow almost any device to be interfaced inside the enclosure, and internal electromagnetic absorbing material reduces RF reflections and hot-spots.
Download datasheet: JRE1714
Features and Benefits
- Double contact door shields ensures repeatable measurements
- 3/4" (19 mm) thick RF absorbing foam deadens standing waves and reflections
- Heavy duty dual stainless steel hinges
- Rugged welded aluminum construction for long life
- Wide variety of connector options for every use
- Four 60mm honeycomb style vents, AC or DC fan is available
Two universal I/O plates (7" x 7" 180x180mm) with incredible connector options. Easily changed in the field for multiple uses or interchange with other enclosures. JRE Test "C" size I/O Plates.
-100dB from DC to 1GHz, -95dB to 3GHz, -85dB to 6GHz
Outside: 10.5" H x 17.25" W x 14.25" D
265 x 440 x 360 mm
Inside: 9" H x 15.75" W x 12.75" D
230 x 400 x 320 mm
JRE 1714 I/O Options
Configuring your JRE RF Test Chamber is simple, fast and easy.
Determine what sort of I/O connections are needed for your particular test needs. All I/O is contained on the removable I/O plate and this plate is custom designed and manufactured for your particular needs. A wide variety of filtered I/O interfaces are available as well as RF connectors, filtered feed-through capacitors, power strips, and ventilation options are available.
Contact JRE with your requirements and a custom I/O plate will be designed expressly for your test chamber. This plate will then be populated with the selected interfaces, mounted on the test chamber, final tested and then shipped to you. JRE’s extensive inventory allows us to ship your custom configured test chamber in as little as two to three days!
The world leader for a reason...
JRE’s RF Test chambers are used by hundreds of test labs and production facilities throughout the world. Fast off-the-shelf delivery, superb technical support and leading edge patented designs help you to confidently design and test any wireless product with exact, repeatable results. The industry's widest line of standard RF test enclosures provides superior isolation from VLF to over 6 GHz, covering the entire range of popular commercial, private and government communications systems. Need to go higher for 5G or microwave tests? Our 'Enhanced' option provides industry leading isolation all the way up to 28 GHz. Whether you are designing, integrating, or production testing the next generation Wi-Fi, WLAN, 5G Cellular, or IoT, you can rely on JRE to ensure your tests are reliable and repeatable.