Slim rack mountable enclosure - ideal for multiple unit device tests
- Roomy 5.5 x 15.5 x 22.5 inches 140 x 390 x 570 mm inside
- Excellent RF Isolation
- Fits on any benchtop or into any standard sliding 19" rack shelf
- Rugged welded aluminum construction with cover stiffeners
- Wide selection of I/O options
- Large size with dual I/O plates, ideal for tests involving multiple devices within the enclosure
Designed for testing devices with a flat form factor that need plenty of I/O, the rack-mountable JRE 1724A is ideal. Similar to our JRE 1724, but not as high, you can place multiple devices within its large footprint. Dual I/O panels allow for a multitude of connectors and interfaces. The JRE 1724A comes standard with honeycomb style vent. JRE 1724A rear Shielded Test Enclosure
Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble free operation over its lifespan. Our wide selection of I/O connectors allow almost any device to be interfaced inside the enclosure, and internal electromagnetic absorbing material reduces RF reflections and hot-spots.
Download datasheet: JRE1724-A
Features and Benefits
- Double contact door shields ensures repeatable measurements
- 3/4” (19 mm) thick RF absorbing foam deadens standing waves and reflections
- Heavy duty stainless steel friction hinges
- Rugged welded aluminum construction for long life
- Includes 80mm vent option, AC or DC fan optional
- Wide variety of connector options for every use
Two universal I/O plates (4" x 6" 100 x150mm) with incredible connector options. Easily changed in the field for multiple uses. JRE Test "D" size I/O plate.
Standard product: -100dB from DC to 1GHz, -95dB to 3GHz, -85dB to 6GHz
Enhanced 5G/Microwave option (product suffix "MW"): -120dB to 1GHz, -115dB to 3GHz, -100dB to 28GHz
Outside: 7" H x 17" W x 24" D
180 x 430 x 610 mm
Inside: 5.5" H x 15.5" W x 22.5" D
570 x 390 x 140 mm
JRE 1724A I/O Options
Configuring your JRE RF Test Chamber is simple, fast and easy.
Determine what sort of I/O connections are needed for your particular test needs. All I/O is contained on the removable I/O plate and this plate is custom designed and manufactured for your particular needs. A wide variety of filtered I/O interfaces are available as well as RF connectors, filtered feed-through capacitors, power strips, and ventilation options are available.
Contact JRE with your requirements and a custom I/O plate will be designed expressly for your test chamber. This plate will then be populated with the selected interfaces, mounted on the test chamber, final tested and then shipped to you. JRE’s extensive inventory allows us to ship your custom configured test chamber in as little as two to three days!
The world leader for a reason...
JRE’s RF Test chambers are used by hundreds of test labs and production facilities throughout the world. Fast off-the-shelf delivery, superb technical support and leading edge patented designs help you to confidently design and test any wireless product with exact, repeatable results. The industry's widest line of standard RF test enclosures provides superior isolation from VLF to over 6 GHz, covering the entire range of popular commercial, private and government communications systems. Need to go higher for 5G or microwave tests? Our 'Enhanced' option provides industry leading isolation all the way up to 28 GHz. Whether you are designing, integrating, or production testing the next generation Wi-Fi, WLAN, 5G Cellular, or IoT, you can rely on JRE to ensure your tests are reliable and repeatable.