Designed for I/O intensive device tests
- Roomy 22.5 x 15.5 x 18.5 inches 570 x 390 x 470 mm inside
- Available with rack mounting side rails - add $119.00
- Includes honeycomb style vents, optional fan available
- Wide selection of I/O options with two universal I/O plates
- Easily holds tall devices
- Rugged welded aluminum construction
- Easy to open and close with single handle operation
- Excellent RF Isolation
Do you have tall devices to test, especially ones needing plenty of I/O? The JRE 1720 is the answer!
Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan. A JRE exclusive, our door latch mechanism allows easy single handle door operation, plus a key lock allows security of the test devices inside. Ventilation is standard with our JRE exclusive honeycomb style vents in enclosure rear and door and fans may be added optionally. The JRE1720 can be supplied with rack mounting side rails to fit any standard 19 inch rack for an additional $119.00.
A pair of universal I/O plates allow almost any device to be interfaced inside the enclosure, and internal electromagnetic absorbing material reduces RF reflections and hot-spots.
Download datasheet: JRE1720
Features and Benefits
- Double contact door shields ensures repeatable measurements
- Single handle door closing with 3 point engagement for excellent RF shielding
- Available with rack mounting side rails
- 3/4" (19 mm) thick RF absorbing foam deadens standing waves and reflections
- Four heavy duty stainless steel hinges
- Rugged welded aluminum construction for long life and usable weight
- Wide variety of connector options for every use
- Key lock on door can be used to secure door shut for security
Two universal I/O plates (7" x 7" 180x180mm) with incredible connector options. Easily changed in the field for multiple uses or interchange with other enclosures. JRE Test "C" size I/O Plates.
-100dB from DC to 1GHz, -95dB to 3GHz, -85dB to 6GHz
All JRE Test chambers, and many JRE filtered interfaces, can be optionally ordered to operate to 28 GHz @ > 85dB isolation, contact the factory for details
Outside: 24" H x 17" W x 20" D
610 x 430 x 510 mm
Inside: 22.5" H x 15.5" W x 18.5" D
570 x 390 x 470 mm
JRE 1720 Filtered Interface and Connector I/O Options
Configuring your JRE RF Test Chamber is simple, fast and easy. Choose from these ready-to-go I/O plates with the most common filtered interfaces and connectors and your test chamber can be shipped in just a few days - or have a custom design in about a week, with whatever connectors and filtered interfaces you desire.
Want a different set of connectors or filtered interfaces? Contact JRE with your requirements and a custom I/O plate will be designed expressly for your test chamber. This plate will then be populated with the selected interfaces, mounted on the test chamber, final tested and then shipped to you. Other options such as fans, vents. internal AC power strips, fiber optic connectors can all be accommodated. JRE’s extensive inventory allows us to ship your custom configured test chamber in as little as one week!
The world leader for a reason...
JRE’s RF Test chambers are used by hundreds of test labs and production facilities throughout the world. Fast off-the-shelf delivery, superb technical support and leading edge patented designs help you to confidently design and test any wireless product with exact, repeatable results. The industry's widest line of standard RF test enclosures provides superior isolation from VLF to over 6 GHz, covering the entire range of popular commercial, private and government communications systems. Need to go higher for 5G or microwave tests? Our 'Enhanced' option provides industry leading isolation all the way up to 28 GHz. Whether you are designing, integrating, or production testing the next generation Wi-Fi, WLAN, 5G Cellular, or IoT, you can rely on JRE to ensure your tests are reliable and repeatable.