JRE 1618 RF Shielded Test Enclosure


Inside dimensions: 3 x 14.5 x 16.5 inches, (75 x 370 x 420 mm)

SKU: JRE 1618 Category:


Low profile, loads of I/O Capability!

  • Roomy 3 x 14.5 x 16.5 inches, 75 x 370 x 420 mm inside
  • Wide selection of I/O options with our universal I/O plates - space for 2 plates!
  • Built-in honeycomb style vents
  • Rugged welded aluminum construction
  • Dual latches ensure tight RF shielding
  • Excellent RF Isolation

Low profile devices with large amounts of I/O connectivity have found a home in the JRE 1618.

Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan.

Tough ‘honeycomb’ vent maintains shielding effectiveness throughout the full frequency range. Optional fan is available for additional airflow.

The two universal I/O plates allow almost any device to be interfaced inside the enclosure, and internal electromagnetic absorbing material reduces RF reflections and hot-spots.

Download datasheet: JRE1618

Features and Benefits

  • Double contact door shields ensures repeatable measurements
  • 3/4" (19 mm) thick RF absorbing foam deadens standing waves and reflections
  • Heavy duty stainless steel friction hinges
  • Rugged welded aluminum construction for long life
  • Wide variety of connector options for every use


Two universal I/O plates (2.75 x 6" - 70 x 150mm) with incredible connector options. Easily changed in the field for multiple uses. JRE Test "A" size I/O plates.


-100dB from DC to 1GHz, -95dB to 3GHz, -85dB to 6GHz


Outside: 4.5" H x 16" W x 18" D
115 x 405 x 460 mm
Inside: 3" H x 14.5" W x 16.5" D
75 x 370 x 420 mm

JRE 1618 I/O Options

Configuring your JRE RF Test Chamber is simple, fast and easy.

Determine what sort of I/O connections are needed for your particular test needs. All I/O is contained on the removable I/O plate and this plate is custom designed and manufactured for your particular needs. A wide variety of filtered I/O interfaces are available as well as RF connectors, filtered feed-through capacitors, power strips, and ventilation options are available.

Contact JRE with your requirements and a custom I/O plate will be designed expressly for your test chamber. This plate will then be populated with the selected interfaces, mounted on the test chamber, final tested and then shipped to you. JRE’s extensive inventory allows us to ship your custom configured test chamber in as little as two to three days!


The world leader for a reason...

JRE’s RF Test chambers are used by hundreds of test labs and production facilities throughout the world. Fast off-the-shelf delivery, superb technical support and leading edge patented designs help you to confidently design and test any wireless product with exact, repeatable results. The industry's widest line of standard RF test enclosures provides superior isolation from VLF to over 6 GHz, covering the entire range of popular commercial, private and government communications systems. Need to go higher for 5G or microwave tests? Our 'Enhanced' option provides industry leading isolation all the way up to 28 GHz. Whether you are designing, integrating, or production testing the next generation Wi-Fi, WLAN, 5G Cellular, or IoT, you can rely on JRE to ensure your tests are reliable and repeatable.